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axic.com
Title: Axic Inc - Reactive Ion Etch, PECVD, Rapid Thermal Processing Equipment
Description: AXIC, Inc manufactures and distributes semiconductor plasma processing equipment and Thin Film Metrology tools (Ellipsometer, Spectroscopic and Discrete Wavelength Ellipsometry, Film Thickness Probe, Reflectometer) for the semiconductor, III-V compound semiconductor, optics, photonics, optoelectronics, nanotechnology and micro electromechanical system (MEMS) industries. We offers six product line

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In this section your find top 10 Ad Keywords and Organic Keywords.
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Sample Ad Keywords
 
Unfortunately, now we provide stats only for first 10 keywords per site, but we are hoping to increase this number in the future.

Avsusergroups.org: NCCAVS - User Groups
Keywords: thin film metrology; micro roughness; megasonic cleaning; plasma applications; elipsometer; cmp technology; microroughness; copper removal; hitachi cmp; vacuum society;

Azom.com: AZoM™ - The A to Z of Materials and AZojomo - The "AZo Journal of Materials Online"

A totally free access materials knowledge base and news service for the engineering, design and materials community worldwide. Content includes the whole materials spectrum of Metals, Ceramics, Polymers and Composites.
Keywords: upvc; laser particle size analyzer; aluminium casting; laser diffraction particle size; materials; stainless steel fabrication; aluminium plate; 304 stainless steel; stainless steel 304; aluminium bar;

Bfioptilas.se: BFi OPTiLAS Specialist Distributor for Nordic Operations

We provide Electronic and Photonics products for Sweden, Denmark, Norway, Finland, and Baltic States Territories.
Keywords: bfi optilas; thin film metrology;

Electroiq.com: ElectroIQ.com - Electronics Manufacturing Industry News, Products, Services

ElectroIQ, the portal for electronics manufacturing covering Solid State Technology, Semiconductors, Photovoltaics, Advanced Packaging, Nanotech-MEMS
Keywords: small; solid state; clean rooms; advanced packaging; cleanrooms; solid state technology; passivation layer; wire bonding; semiconductor news; semicon west;

Jpkummer.com: John P Kummer - Semiconductor tools and materials

The John P Kummer group supplies test, metrology, inspection and reliability & failure analysis tools and equipment to the European semiconductor industry.
Keywords: kummer; wafer inspection equipment; wafermap; thin film metrology; sales map software; wafer map; sem preparation; semiconductor tools; sample preparation for sem; reliability failure;

Kla-tencor.com: Home | KLA-Tencor

KLA-Tencor offers the industry's widest range of best-of-breed inspection and metrology tools -- combined with industry-leading process control expertise and best-practices know-how.
Keywords: kla tencor; kla; icos; profilometer; tencor; ade; ambios; ambios technology; surface roughness measurement; icos vision systems;

Panalytical.com: PANalytical - XRD and XRF Analytical Instruments

PANalytical is the world's leading supplier of analytical instrumentation and software for X-ray diffraction (XRD) and X-ray fluorescence spectrometry (XRF), with more than half a century of experience. The materials characterization equipment is used for scientific research and development, for industrial process control applications and for semiconductor metrology.
Keywords: panalytical; xrd; x ray diffraction; almelo; edxrf; xrpd; lims system; x'pert; sample preparation; diffractometer;

Rudolphtech.com: Rudolph : Home
Keywords: rudolph technologies; rudolph; flanders company; nsx; wafer saw; yield analysis; defect inspection; solar software; sentinel software; rvsi;

Sci-soft.com: Scientific Computing International - Raising Thin Film Metrology to a New Level. SCI offers metrology systems for thin-film material characterization, with models that range from table-top systems sui

Scientific Computing International (SCI) provides high resolution thin film metrology tools and analysis software products to leading companies in the semiconductor, optoelectronics, display, MEMS, data storage, and optical coating industries. SCI also provides software for optical thin film design and material analysis including FilmWizard, an optical thin film design and material analysis progr
Keywords: duv; thin film measurement; thin film metrology; scientific computing; thin film measurements; spectroscopic ellipsometer; thin film software; film measurement; measuring surface roughness; thin film design;
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