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kmac.to
Title: thin film thickness measurement, surface plasmon resonance£üK-Mac
Description: K-Mac, a leading measurement & analysis solution company, is specialized in thin film thickness measurement, uv-vis spectrometer detector, educational spectrometer, fiber optic spectrometer, surface plasmon resonance

Site: "kmac.to"
IP Address:
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This site within Alpha Directory: m ma


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Azonano.com: A to Z Nanotechnology | Nanotechnology News, Articles, Directory and more

A Free To Access Nanotechnology Information Site, Sections Include A Nanotechnology Journal, Nanotechnology News, New Nanotechnology Products, Nanotechnology Suppliers/Companies, Nanotechnology Experts, Nanotechnology Courses, Nanotechnology Events, Nanotechnology Books, Nanotechnoogy Classifieds and Nanotechnology Jobs. We've Broken Nanotechnology Down By Application, Industy and Material to
Keywords: zetasizer; new microprocessor; particle size analyzers; alfa aesar; affymetrix; degussa ag; nanotechnology applications; microspectrophotometer; aoac; particle characterization;

En.wikipedia.org: Wikipedia, the free encyclopedia
Keywords: facebook; gmail; g m a i l; google; s e x; sex; orkut; you tube; mortgage; orange;

Filmetrics.com: Thin Film Thickness Measurement Systems by Filmetrics

Affordable thin film thickness measurement systems from the world sales and technology leader.
Keywords: thin film thickness measurement; coating thickness gauge; filmetrics; thin film measurement; thin film measurement; coating thickness; thin film measurements; thickness measurement; film thickness; coating thickness measurement;

Ftgsoftware.com: FTG Software - Programs for Optical Thin Films and Spectrophotometer DAQ

FilmStar optical thin film software is used to design, monitor and measure optical coatings. Scantraq controls and acquires data from Perkin-Elmer, Varian Cary and Agilent (HP) spectrophotometers.
Keywords: film star; film star; filmstar; ftg; film star; film star; film start; film thickness; coating software; thin film coating;

Missionpeakoptics.com: The Leader in Thin Film Thickness Measurement: Mission Peak Optics, Inc.

Manufacturer of Semiconductor Thin Film Thickness Measurement Systems, capable of measuring oxide; nitride; polysilicon; photoresist; CIE color; CMP; Endpoint; and Color Filter by using UV, VIS, NIR, Spectrometer. Automatic and Compact models are available.
Keywords: film thickness measurement; mission peak; thin film measurement; thin film thickness measurement; film thickness; thickness measurement; thin film measurements; thin film thickness; film measurement; film thickness measurements;

Nanovea.com: NANOVEA | A Better Measure.

3D Profilometers, Mechanical Testers, Tribometers & Lab Testing services combined to define today's standard for tomorrow's materials.
Keywords: profilometer; tribometer; film thickness measurement; optical profilometer; profilometers; laser profilometer; thin film thickness measurement; scratch tester; plastic friction; mechanical tester;

Novacam.com: Novacam: Optical Profilometry and OCT – noncontact surface metrology, roughness, thickness, hard-to-reach surfaces

Novacam builds fiber-based optical profilometers for industrial surface roughness and thickness measurements, and OCT systems for bio-medical imaging
Keywords: optical profilometry; roughness measurement; 3d profilometer; profilometry; non contact profilometer; volume loss; multilayer thickness;

Sensofar.com: Non contact metrology: Non contact measurement, surface metrology by Sensofar

Sensofar is a high technology company specialized in non contact metrology which has developed different tools to make 3D non-contact surface measurement
Keywords: sensofar; optical profilometry; thin film measurement; contact surface; thin film measurements; solutions analysis; non contact metrology; film measurement; surface metrology; non contact thickness measurement;

Stellarnet-inc.com: StellarNet | Developing Intelligence with Light

StellarNet builds ruggedized miniature fiber optic spectrometers for a complete spectrum of Lab and Field measurements
Keywords: stellarnet; spectroradiometer; fiber optic spectrometer; film thickness; analytical instrumentation; miniature spectrometer; thin film measurement; fibre multiplexer; led measurement; thin film thickness;

Www-kyg.stanford.edu: Khuri-Yakub - Home
Keywords: ultrasonic transducers; micromachined; yakub; endoscopic imaging; contact transducer; contact measurement; ultrasonic transducer design; thin film thickness measurement; thin film thickness; scanning acoustic microscope;
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